Synopsys.ai

Synopsys DSO.ai™ searches for optimization targets in very large solution space of chip design by using AI engines to enhance power, performance, and area. DSO.ai facilitates massive scaling in the exploration of choices by building on training data and applying learnings across projects to accelerate tape-out and achieve PPA targets.

Synopsys VSO.ai™ is the industry’s first AI-driven verification solution aimed at achieving higher coverage quality faster so that bugs don’t go undetected. The technology identifies and eliminates redundancies in regressions and automates root cause analysis. VSO.ai examines the RTL and stimulus to infer coverage and highlight coverage gaps, saving significant time and ensuring a high ROI on tests.

Synopsys TSO.ai™ is the first autonomous AI application for semiconductor test. It optimizes test program generation in complex designs to achieve maximum defect coverage with fewer test patterns. The result is faster automatic test pattern generation runtime and lower silicon test costs.

Synopsys AI-Driven Analog Design solution helps to accelerate the design, implementation, and verification of analog designs. An automated schematic migration feature eases the process of updating devices and parameters to reflect a new process design kit. And, an ML-based layout migration flow takes advantage of “learning” from a previous layout to quickly recreate a similar layout in the new technology, minimizing manual work. Finally, an AI-based design optimization capability ensures that the design achieves the desired target metrics within hours versus days.