A powerful and highly configurable test automation flow provides seamless integration of all Synopsys TestMAX capabilities. Early validation of complex DFT logic is supported through full RTL integration while maintaining physical, timing and power awareness through direct links into the Synopsys Fusion Design Platform. These new features, combined with comprehensive support for early testability analysis and planning, hierarchical ATPG compression, physically-aware diagnosis, logic BIST, memory self-test and repair and analog fault simulation, ensure the Synopsys TestMAX product family addresses critical test issues and enables effective test for the most demanding applications.
- Silicon Design & Verification
- Products
- Solutions
- Resources
- Services
- Community
- Training
- Silicon IP
- Products
- Markets
- Newsletter
- Customer Success
- News
- Resources
- Company
- About Us
- Investor Relations
- Community
- Newsroom
- Resources
- Careers
< Silicon Design & Verification
Silicon Design & Verification
< Products
< Products
< Products
< Products
< Products
< Products
< Products
< Silicon Design & Verification
< Solutions
< Solutions
< Solutions
Cloud
Synopsys in the Cloud
< Solutions
< Solutions
< Silicon Design & Verification
< Resources
< Resources
Verification
Articles
Blogs
Datasheets
Events
News
Newsletters
Success Stories
Videos
Webinars
White Papers
< Resources
< Silicon Design & Verification
< Services
< Services
< Services
< Silicon Design & Verification
< Community
Community
Community Overview
< Community
< Community
< Community
< Community
< Silicon Design & Verification
< Training
< Silicon Design & Verification
Training
Training and Education
< main menu
< Silicon IP
Silicon IP
< Products
< Products
Processor Solutions
ARC Processor IP
Embedded Vision Processor IP
Development Tools
Operating Systems
Ecosystem
ASIP Tools
< Products
Memories & Libraries
Logic Libraries
Memory Compilers
Duet Packages
HPC Design Kit
Embedded Test & Repair
Non-Volatile Memory
< Products
< Products
Analog IP
Data Converters
< Products
< Products
< Products
< Silicon IP
< Markets
< Silicon IP
Newsletter
< Silicon IP
Customer Success
< Silicon IP
News
< Resources
< Resources
< main menu
< Software Integrity
Polaris Platform
Comprehensive application security from developer to deployment
< Software Integrity
< Software Integrity
< Software Integrity
Professional Services
Strategy and programs that address security before, during and after development
< Software Integrity
< Tools
< Tools
< Tools
< Tools
< Software Integrity
< Services
Managed Security Testing
Managed SAST
Dynamic Analysis (DAST)
Penetration Testing
Mobile Application Security Testing
Network Security Testing
< Services
Professional Services
Strategy and Planning
Architecture & Design
DevSecOps Integration
Cloud Security
Industry Solutions
< Services
< Software Integrity
< Training
< Training
Product Education
< Training
Community
< Software Integrity
< Solutions
< Solutions
< Resources
< Resources
< Software Integrity
< Software Integrity
Customers
< Partners
< Partners
Become a partner
< Software Integrity
< Software Integrity
Blog
< main menu
< About Us
Company
< About Us
< About Us
About Us
About Us
< Investor Relations
< About Us
Investor Relations
Investor Relations
< Community
< About Us
Community
Community
< Newsroom
< About Us
Newsroom
Newsroom
< Resources
< About Us
Resources
Resources
< Careers
< About Us
Careers
Careers
< main menu
Test Automation
Introducing Synopsys TestMAX
The Synopsys TestMAX™ family of products offers innovative, next-level test and diagnosis capabilities for all digital, memory and analog portions of a semiconductor device. The Synopsys TestMAX family contains unique capabilities for automotive test and functional safety as well as technologies that unlock new levels of test bandwidth and efficiency by leveraging high-speed interfaces common on many designs.
Webinar: Samsung Foundry and Synopsys Present Fast, Accurate Silicon Diagnosis & Yield Analysis
Learn More
Test All the Limits
