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Synopsys TestMAX
The Synopsys TestMAX™ family of products offers innovative, next-level test and diagnosis capabilities for all digital, memory and analog portions of a semiconductor device. The Synopsys TestMAX family contains unique capabilities for automotive test and functional safety as well as technologies that unlock new levels of test bandwidth and efficiency by leveraging high-speed interfaces common on many designs.
A powerful and highly configurable test automation flow provides seamless integration of all Synopsys TestMAX capabilities. Early validation of complex DFT logic is supported through full RTL integration while maintaining physical, timing and power awareness through direct links into the Synopsys Fusion Design Platform. These new features, combined with comprehensive support for early testability analysis and planning, hierarchical ATPG compression, physically-aware diagnosis, logic BIST, memory self-test and repair and analog fault simulation, ensure the Synopsys TestMAX product family addresses critical test issues and enables effective test for the most demanding applications.
Enabling Silicon Lifecycle Management with High-Volume Big Data Analytics Solutions
This presentation introduces the benefits of premier data analytics solutions for high-volume semiconductor manufacturing and test for fabless companies, IDMs, OSATs and foundries.
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