Mastering AI Chip Complexity
Explore challenges and solutions in AI chip development
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The Synopsys TestMAX™ family of products offers innovative, next-level test and diagnosis capabilities for all digital, memory and analog portions of a semiconductor device. Unlock new levels of test bandwidth and efficiency with the TestMAX family by leveraging high-speed interfaces common on many designs, including unique capabilities for automotive test and functional safety.
Synopsys TestMAX offers a powerful and highly configurable test automation flow with seamless integration of all Synopsys TestMAX capabilities. Early validation of complex DFT logic is supported through full RTL integration while maintaining physical, timing and power awareness through direct links into the Synopsys Digital Design Family. These new features, combined with comprehensive support for early testability analysis and planning, hierarchical ATPG compression, physically-aware diagnosis, logic BIST, memory self-test and repair and analog fault simulation, ensure the Synopsys TestMAX product family addresses critical test issues and enables effective test for the most demanding applications.
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Making the Right Connections: Taking the Guess Work out of DFT Connectivity Validation
Success Story
STMicroelectronics Successful Deployment of Synopsys Embedded Memories Diagnosis Flow for Advanced Technology Nodes
White Paper
Synopsys TestMAX Advisor: Accelerating Shift Left with Early RTL Analysis and Optimization
