Advanced Pattern Generation
Synopsys TestMAX™ ATPG is Synopsys’ state-of-the-art pattern generation solution that enables design teams to meet their test quality and cost goals with unprecedented speed. It delivers unparalleled runtime, ensuring patterns are ready when early silicon samples are available for testing. In addition, it generates significantly fewer patterns than existing solutions, allowing designers to reduce the time and cost of testing silicon parts, or increase test quality without impacting test cost. TestMAX ATPG is integrated with Synopsys’ patented TestMAX DFT.