TetraMAX® II is Synopsys' next-generation ATPG and diagnostics solution that lets design teams meet their test quality and cost goals with unprecedented speed. It delivers an order of magnitude faster runtime, ensuring patterns are ready when early silicon samples are available for testing. Additionally, TetraMAX II generates 25 percent fewer patterns, allowing IC design teams to shorten the time and lower the cost of testing silicon parts or, depending on design requirements, increase test quality for the same cost.
TetraMAX II uses new test generation and diagnosis engines that are extremely fast, exceedingly memory-efficient, and highly optimized for fine-grained multithreading of ATPG and diagnosis processes across multiple cores. Although it is built on new engines to dramatically improve runtime and pattern count, the rule checking, design and fault modeling infrastructure, and tool interfaces are unchanged for easy, risk-free deployment.