Optimize Test QoR & TTM with AI-Driven Technology

Continuously increasing semiconductor design sizes and complexity have resulted in increased test costs. Today’s competitive environment and critical market windows are pushing companies to adopt aggressive design schedules. The traditional method of manual iterations and fine-tuning test configurations to optimize test quality-of-results (QoR) is highly unpredictable and inefficient. Engineers can no longer rely on such approaches to meet deadlines or achieve optimal results. With a global shrinking engineering workforce, intelligent automation is needed for higher productivity and delivering first-time-right results.

This Synopsys webinar discusses our newly introduced AI-driven test technology called Synopsys TSO.ai™– Test Space Optimization AI that dramatically minimizes test cost and time-to-market for today's complex designs. Synopsys TSO.ai learns and converges the large ATPG search space to automatically minimize test patterns and eliminate ineffective user iterations, enabling expert-level productivity at scale. Current engagements with leading semiconductor companies are showing an average of 20% to 25% pattern count reduction or even higher on some designs.