In-Chip PVT Monitoring and Sensing

Driven by demands for ever-increasing design complexity and gate density manufacturability, adoption of Process, Voltage and Temperature (PVT) monitoring is now critical to successful advanced node chip design. The In-Chip Monitoring Subsystem from Synopsys (using formerly Moortec technology) allows for a greater understanding of device fabrication, process variability and in-field dynamically changing conditions.


DesignWare PVT Sensor IP

The sensing technology, available from 28nm down to 3nm, allows for enhanced performance optimization and reliability for Data Center, AI, Automotive, 5G and Consumer applications.


In-Chip PVT Monitoring and Sensing

 

Highlights
  • Embedded, distributed sensor network
  • Real-time low-latency thermal and voltage supply analysis
  • Process variability measurement
  • High accuracy sensors for optimal DVFS and AVS implementation
  • Sensor self-checking and health status
  • Deeply embedded and small sized sensing points
  • Standard bus interfacing to subsystem
  • Production test support including SCAN
  • Easy SoC integration