Adaptive High-Bandwidth Test
Synopsys TestMAXTM ALE and TestMAX SLT form the solution that leverages high-speed interfaces such as a Universal Serial Bus (USB) and PCI Express that exist on many semiconductor devices. The combined solution provides the ability to apply manufacturing tests through these functional interfaces, enabling an extremely high test bandwidth compared to traditional test interfaces, often reducing the number of dedicated test pins. Additionally, all tests are portable to the device, from die testing to in-system test and at all stages of the product life-cycle.
