In this episode of Chalk Talk, Amelia Dalton chats with Stephen Crosher of Synopsys about silicon lifecycle management and how to take full advantage of the optimization opportunities available for scalability, reliability, and much more.
Since 2010, Moortec (now part of Synopsys) has supported its global customer base with high accuracy, highly featured and well-supported monitoring subsystem technology. Targeting foundry nodes from 28nm down to 3nm, the high distributed sensing fabric is used today across Data Center, AI, Automotive, 5G and Consumer applications for these reasons:
The comprehensive subsystem solution consists of a range of sensors communicating to a central controller (or hub). Configurable by application, the subsystem is easily integrated into the design-flow and architecture of the chip. Developed with digital design, production test development and software design teams and in mind, the monitoring solution connects in to an SoC architecture via standard interfaces for normal and test phase operation. As a major contributor to the Silicon Lifecycle Management (SLM) platform, the flexible monitoring subsystem accommodates the evolving landscape of extended sensor products designed to measure in-chip conditions continuously throughout a silicon chip’s lifetime, from fabrication to end-of-life. The range of sensors provides valuable data which enables powerful analytics algorithms to optimize device performance, enhance reliability and allow for predictive maintenance and failure.
Fig 1. Subsystem Solution for Monitoring and Sensing Configurable by Application
Real-Time Analysis
Silicon Assessment
Sensor Management
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