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The PMM unit enables timing margin measurement of selected path in-test or mission mode. Timing margin is a key indicator of silicon structural health. Each PMM can handle multiple end points for measurement and each PMM controller can support multiple PMMs. On a single chip you can place numerous PMMs without much area overhead, providing very valuable data which can be analyzed for insights to optimize any phase of silicon lifecycle. EDA and software automation along with path selection logic plays a crucial role in making PMMs practical.