Synopsys 29th Annual Test & SLM Special Interest Group (SIG)

Monday, October 9, 2023
6:30 p.m. - 10:00 p.m.
The Westin Anaheim Resort, Anaheim, CA

All members of the design and test community are invited to register to attend Synopsys 29th Annual Test & SLM Special Interest Group (SIG) at the 2023 International Test Conference (ITC). 

The event will host experts from leading companies including Kioxia, SARC, MediaTek and others who will describe how Synopsys Test and SLM solutions including Test-AI, distributed ATPG, high-speed test fabric, and automotive test are enabling them to achieve their quality and TTM goals.

Attendees will also have the opportunity to meet with Synopsys experts to discuss and learn more about Test and SLM technologies. Appetizers and cocktails will be served, followed by a sit-down dinner and prize drawings!


6:30 p.m. - 7:15 p.m. 

7:15 p.m. - 7:20 p.m.  


7:20 p.m. - 7:30 p.m. 


7:30 p.m. - 9:00 p.m.









9:00 p.m. - 10:00 p.m.

Cocktail Reception


Yervant Zorian, Synopsys Fellow at Synopsys

Opening Remarks and Presentation
Dr. Debendra Das Sharma, Intel Senior Fellow at Intel Corporation, Chair Universal Chiplet Interconnect Express (UCIe) Consortium


Achieving Dramatic Reduction in Turn-around Time and Test Cost with Highly Distributed ATPG and
Shohei Morishima, Specialist at Kioxia

Methodology for Manufacturing and In-system Test on Mobile and Automotive GPUs with Streaming Fabric, SEQ/XLBIST and IEEE1687
Rajkumar Pampana, Principal Engineer at Samsung SARC

Implementation of Streaming Fabric and Sequential Compression Technology on Smartphone SOC with High-speed USB Interface
Prashant Balakrishnan, Director at MediaTek

And more! 

Raffle Drawing and Dessert

Synopsys at International Test Conference (ITC)

Sunday, October 8 - Friday, October 13, 2023

Disneyland Hotel, Anaheim, CA


Exhibit Hours

Tuesday, October 10
10:30 a.m. - 5:30 p.m.

Wednesday, October 11
9:30 a.m. - 4:30 p.m.

Thursday, October 12
9:30 a.m. - 1:00 p.m.

Platinum Sponsor Session

Tuesday, October 10 | 4:00 – 6:00 p.m. | Magic Kingdom Ball 3

Session C2: Presentations of Platinum Supporters

Pioneering AI Solutions for Test & Silicon Lifecycle Management (SLM)

Synopsys Presenter: Matt Knowles

Visit the Synopsys Booth

The Synopsys TestMAX™ family offers innovative test and diagnosis for all silicon designs and enables a unified flow within the Synopsys’ Digital Design Family. Synopsys TestMAX works in conjunction with the latest Synopsys Silicon Lifecyle Management (SLM) technology for enhanced in-chip observability, silicon health and analytics, meeting both design and test goals concurrently.

This year we will be highlighting industry first Test and SLM technologies that encompass integrated tools, IP and methodologies which enable optimized quality, performance and reliability at each phase of the device lifecycle from in-design, in-ramp, in-production and in-field.

See demonstrations on:

  • High Speed Test Over HSIO                                                         
  • Test Optimization                                                      
  • Silicon.da Real-Time Analytics
  • Advanced Logic/Memory Test
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Let's Meet

Whether you want a quick chat to catch up or want to go deep on details, please reach out to us to schedule an on-site meeting.

Schedule a meeting


Poster Sessions

Wednesday, October 11 | 12:00 - 2:00 p.m. | Exhibit Floor

Structural Tests over HSIO on SLT (ATS 7038)

Advantest Author: Sri Ganta; Synopsys Authors: Ash Patel, Ramsay Allen

Test Robustness and Glitch Detection with TestMAX Advisor

Ericsson Authors: Anurag Jindal, Dhinakaran Varadhan; Synopsys Authors: Raja Koneru, Ramsay Allen

Effective Yield Boost and Cost Saving by Volume Diagnosis using Yield Explorer

MediaTek Authors: Anti P.H. Tseng, Joe Y.J. Chiu, Emma Chou and Kun-Yang Hsu; Synopsys Authors: Thomas C.Y. Liu, Teng-Wei Shao, James Z.J. Lin,

Test Scalability with Sequential Compression Technology

MediaTek Authors: Mark Nathan, Lichao Chen, Tommy Ngo, Minh Chau; Synopsys Authors: Lakshmi Kalingavaram Ramachandra, Bala Tarun Nelapatla

Cell-Aware Failure Analysis: Advanced Cell-Aware Techniques to Identify the FEOL/MOL Layer Systematic Defects in Cutting-Edge Technology

Samsung Foundry Authors: Jaeseok Park, Hyunyeol Lim, Yongseok Son, Dongkwan Han; Synopsys Authors: Jeongsu Park, Yewon Lee, Camelia Hora, Ruifeng Guo

The Importance of Sensor Analytics in Enabling Silicon Lifecycle Management

Synopsys Authors: Mark Laird, Ramsay Allen

Deep Silicon Data and Analytics for Lifelong Safety and Reliability

Synopsys Authors: Dan Alexandrescu, Lorin Kennedy, Ramsay Allen, Jamileh Davoudi, Pawini Mahajan

Holistic Approach to Solving Silent Data Corruption

Synopsys Author: Adam Cron

Advanced Test Point and Wrapping Techniques for Automotive Designs

NXP Authors: Geoff Shofner, Chris Falk; Synopsys Authors: Raja Koneru, Ramsay Allen

Physical Connection Aware SMS BIST Implementation for Abutted Design

Synopsys Authors: Doo Kim, Mohammed Mosin Junjawadkar, Dooyoung Kim, Manish Arora

New TestMAX XLBIST Parallel Interface

ST Author: Marco Casarsa; Synopsys Author: Alfredo Conte

Deploying Cutting-Edge Adaptive Test Analytics Apps Based on a Closed-Loop Real-Time Edge Analytics and Control Process Flow into the Test Cell

Advantest Author: Ken Butler; Synopsys Author: Guy Cortez

Technical Sessions

Tuesday, October 10 | 2:00 – 2:30 p.m. | Magic Kingdom Ball 1

Session A1: Industrial Practices (Long Papers)

A Case Study on IEEE 1838 Compliant Multi-Die 3DIC DFT Implementation

TSMC Presenter: Anshuman Chandra; TSMC Authors: Anshuman Chandra, Moiz Khan, Sandeep Kumar Goel, Ankita Patidar, Fumiaki Takashima; Synopsys Authors: Manish Arora, Bharath Shankaranarayanan, Vistrita Tyagi, Vuong Nguyen

Tuesday, October 10 | 1:30 – 3:00 p.m. | Magic Kingdom Ball 4

Session D1: Modern Memory Trends (Special Session)

Synopsys Commentary: Gurgen Harutyunyan

Talk 1: “Test Challenges for GAA in the Race Between Nanometers and Angstroms”

Synopsys Authors: Karen Amirkhanyan, Hayk Danoyan, Artur Ghukasyan, Gurgen Harutyunyan, Knarik Kyuregyan, Grigor Tshagharyan

Talk 3: “Utilizing Clever ECC Analytics to Improve Memory Lifecycle Management”

AMD Author: Costas Argyrides; Synopsys Authors: Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian

Tuesday, October 10 | 4:00 – 6:00 p.m. | Magic Kingdom Ball 3

Session C2: Presentations of Platinum Supporters

Pioneering AI Solutions for Test & Silicon Lifecycle Management (SLM)

Synopsys Presenter: Matt Knowles

Tuesday, October 10 | 4:00 – 6:00 p.m. | Magic Kingdom Ball 4

Session D2: HIR & UCIe (Special Session)

Synopsys Commentary: Yervant Zorian

Thursday, October 12 | 10:30 – 12:00 p.m. | Magic Kingdom Ball 4

Session D5: SLM – In-Field Testing

Synopsys Commentary: Yervant Zorian

ARTS Workshop

Thursday, October 12 | 5:00 - 6:30 p.m.

Technical Session 1 – Automotive Chip Reliability and Resilience

Path Margin Monitor for Silicon Lifecycle

Synopsys Authors: Kranthi Kandula, Ramalingam Kolisetti

Friday, October 13 | 10:30 - 12:00 p.m.

Technical Session 3 – Analog Testing Solutions for Automotive Chips

Analog/Mixed-signal Fault Analysis using Custom Fault Approach

Synopsys Authors: Leela Krishna Thota, Varun Reddy, Sreenivasa Rao Vuttaravilli

SLM Workshop

Thursday, October 12 | 5:15 – 6:30 p.m.
    Panel Discussion  - Silent Data Corruption: Requirements and
    Mitigation | Moderator: Mehdi Tahoori (KIT)

    Harish Dixit (Meta), Sankaranarayanan Gurumurthy (AMD),                      Yervant Zorian (Synopsys), Dimitris Gizopoulos (University of                  Athens), Adit Singh (Auburn U)

Friday, October 13, 2023 | 8: 30 -10:00 a.m.

           Technical Session  - Utilizing ECC Analytics to Improve
           Memory Lifecycle Management

            Costas Argyrides (AMD, USA), Grigor Tshagharyan (Synopsys,                 Armenia), Gurgen Harutyunyan (Synopsys, Armenia), Yervant                   Zorian (Synopsys, USA)

Friday, October 13| 10:30am – 12:00 p.m.

            Panel Discussion - Ushering in the Dependability Era with                    IEEE P2851 |  Moderator: Fred Gruner (Nvidia)

  Jyotika Athavale (Synopsys), Chen, Wei-Ren (New Taipei     City),Viswanathan Pillai (TI), Nir Maor (Qualcomm) Meirav Nitzan   (Qualcomm)

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