Cloud native EDA tools & pre-optimized hardware platforms
All members of the design and test community are invited to register to attend Synopsys 29th Annual Test & SLM Special Interest Group (SIG) at the 2023 International Test Conference (ITC).
The event will host experts from leading companies including Kioxia, SARC, MediaTek and others who will describe how Synopsys Test and SLM solutions including Test-AI, distributed ATPG, high-speed test fabric, and automotive test are enabling them to achieve their quality and TTM goals.
Attendees will also have the opportunity to meet with Synopsys experts to discuss and learn more about Test and SLM technologies. Appetizers and cocktails will be served, followed by a sit-down dinner and prize drawings!
6:30 p.m. - 7:15 p.m.
7:15 p.m. - 7:20 p.m.
7:30 p.m. - 9:00 p.m.
9:00 p.m. - 10:00 p.m.
Yervant Zorian, Synopsys Fellow at Synopsys
Raffle Drawing and Dessert
Sunday, October 8 - Friday, October 13, 2023
Disneyland Hotel, Anaheim, CA
Wednesday, October 11 | 12:00 - 2:00 p.m. | Exhibit Floor
Structural Tests over HSIO on SLT (ATS 7038)
Advantest Author: Sri Ganta; Synopsys Authors: Ash Patel, Ramsay Allen
Test Robustness and Glitch Detection with TestMAX Advisor
Ericsson Authors: Anurag Jindal, Dhinakaran Varadhan; Synopsys Authors: Raja Koneru, Ramsay Allen
Effective Yield Boost and Cost Saving by Volume Diagnosis using Yield Explorer
MediaTek Authors: Anti P.H. Tseng, Joe Y.J. Chiu, Emma Chou and Kun-Yang Hsu; Synopsys Authors: Thomas C.Y. Liu, Teng-Wei Shao, James Z.J. Lin,
Test Scalability with Sequential Compression Technology
MediaTek Authors: Mark Nathan, Lichao Chen, Tommy Ngo, Minh Chau; Synopsys Authors: Lakshmi Kalingavaram Ramachandra, Bala Tarun Nelapatla
Cell-Aware Failure Analysis: Advanced Cell-Aware Techniques to Identify the FEOL/MOL Layer Systematic Defects in Cutting-Edge Technology
Samsung Foundry Authors: Jaeseok Park, Hyunyeol Lim, Yongseok Son, Dongkwan Han; Synopsys Authors: Jeongsu Park, Yewon Lee, Camelia Hora, Ruifeng Guo
The Importance of Sensor Analytics in Enabling Silicon Lifecycle Management
Synopsys Authors: Mark Laird, Ramsay Allen
Deep Silicon Data and Analytics for Lifelong Safety and Reliability
Synopsys Authors: Dan Alexandrescu, Lorin Kennedy, Ramsay Allen, Jamileh Davoudi, Pawini Mahajan
Holistic Approach to Solving Silent Data Corruption
Synopsys Author: Adam Cron
Advanced Test Point and Wrapping Techniques for Automotive Designs
NXP Authors: Geoff Shofner, Chris Falk; Synopsys Authors: Raja Koneru, Ramsay Allen
Physical Connection Aware SMS BIST Implementation for Abutted Design
Synopsys Authors: Doo Kim, Mohammed Mosin Junjawadkar, Dooyoung Kim, Manish Arora
New TestMAX XLBIST Parallel Interface
ST Author: Marco Casarsa; Synopsys Author: Alfredo Conte
Deploying Cutting-Edge Adaptive Test Analytics Apps Based on a Closed-Loop Real-Time Edge Analytics and Control Process Flow into the Test Cell
Advantest Author: Ken Butler; Synopsys Author: Guy Cortez
Tuesday, October 10 | 2:00 – 2:30 p.m. | Magic Kingdom Ball 1
Session A1: Industrial Practices (Long Papers)
A Case Study on IEEE 1838 Compliant Multi-Die 3DIC DFT Implementation
TSMC Presenter: Anshuman Chandra; TSMC Authors: Anshuman Chandra, Moiz Khan, Sandeep Kumar Goel, Ankita Patidar, Fumiaki Takashima; Synopsys Authors: Manish Arora, Bharath Shankaranarayanan, Vistrita Tyagi, Vuong Nguyen
Tuesday, October 10 | 1:30 – 3:00 p.m. | Magic Kingdom Ball 4
Session D1: Modern Memory Trends (Special Session)
Synopsys Commentary: Gurgen Harutyunyan
Talk 1: “Test Challenges for GAA in the Race Between Nanometers and Angstroms”
Synopsys Authors: Karen Amirkhanyan, Hayk Danoyan, Artur Ghukasyan, Gurgen Harutyunyan, Knarik Kyuregyan, Grigor Tshagharyan
Talk 3: “Utilizing Clever ECC Analytics to Improve Memory Lifecycle Management”
AMD Author: Costas Argyrides; Synopsys Authors: Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian