FullWAVE Product Overview

FDTD Simulation Software for Photonic Structures

FullWAVE™ simulation tool employs the finite-difference time-domain (FDTD) method to perform a full-vector simulation of photonic structures. It is a highly sophisticated tool for studying the propagation of light in a wide variety of photonic structures, including integrated and fiber-optic waveguide devices, as well as circuits and nanophotonic devices such as photonic crystals. FullWAVE's award-winning, innovative design and feature set has made it the market leader among optical device simulation tools.

FullWAVE FDTD simulation of photonic bandgap y-branch


  • Cutting-edge implementation of mature FDTD algorithm allows for a wide range of simulation and analysis capabilities.
  • Advanced capabilities allow for clustered simulation environment for massive computational increases in speed and efficiency.
  • Fully integrated into the RSoft CAD Environment.


FullWAVE has applications in wide range of integrated and nano-optic devices including, but not limited to:

  • WDM devices such as ring resonators
  • Photonic bandgap circuits
  • Grating structures, surface normal gratings, and other diffractive structures
  • Cavity computations and extractions
  • Nano- and micro-lithography
  • Biophotonics
  • Light scattering
  • Metrology
  • LED extraction analysis
  • Sensor and bio-sensor designs
  • Plasmon propagation effects
  • Surface plasmons
  • Negative refractive index materials


  • Advanced and robust FDTD implementation allowing for full-vector field solutions in arbitrary structures and materials.
  • 2D, radial, and 3D simulation capabilities.
  • Non-uniform mesh.
  • Full control of dispersion, non-linear (chi-2 and chi-3), and anisotropic effects.
  • Frequency-dependent saturable gain model.
  • Includes Perfectly Matched Layer (PML), periodic, and symmetric/anti-symmetric boundary conditions.
  • Advanced excitation options for multiple launch fields, each with different spatial and temporal characteristics such as position, wavelength, direction, polarization, and temporal excitation. Point sources and white light sources are also available.
  • Total-field/scattered-field formulation for scattering problems.
  • A wide range of analysis and monitoring features to measure common electromagnetic quantities such as power flux, energy densities, overlap integrals, far fields and the Poynting Vector. Additionally, both FFT and DFT options are included for frequency analysis.
  • Includes Q-Finder, a utility that automates the search for cavity modes and Q-factors.
  • Automated parametric studies and design optimization using MOST.
  • Increased performance through parallel processing via multi-CPU/core machines and/or clustering across a network of computers. Contact RSoft Sales for licensing policies regarding this feature.

Application Gallery