Eliminate Chip-killing Bugs with Power-Aware RTL CDC Verification

White Paper

Eliminate Chip-killing Bugs with Power-Aware RTL CDC Verification

This white paper provides some background on UPF-aware clock domain crossing challenges and outlines Synopsys VC SpyGlass CDC UPF-aware methodology that can help catch bugs otherwise detected at later design stages and provide consistent behavior across low-power verification as well as implementation flows, resulting in reduced iterations.

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