A 3D-IC is a three-dimensional integrated circuit (IC) built by vertically stacking different chips or wafers together into a single package. Within the 3D-IC package, the device is interconnected using through-silicon vias (TSVs) or hybrid bonding.
In 2D ICs, each die is packaged separately and laid out on a printed circuit board (PCB). Multiple dies in the same packages are then connected using conductive wire paths. Stacking multiple dies atop each other in a single package takes less space than if those dies were placed side by side. Shorter distance between stacked dies allows faster data exchange from one known good die to another, using less energy.
This approach offers several advantages over traditional 2D-IC design, including increased performance, reduced power consumption, and a smaller form factor. 3D-IC design technology allows heterogeneous integration, more efficient use of space, and improved electrical performance compared to traditional 2D-ICs.
3D-ICs use silicon interposers and TSVs for better connectivity among different IPs. A silicon interposer is a thin wafer of silicon that is used in 2.5D and 3D-IC design to connect multiple dies or chips in a single package. It acts as a substrate on which dies are placed and connected using fine-pitch vertical TSVs and microbumps. This allows for better heat dissipation, reduced power consumption, higher density, and improved electrical performance compared to traditional 2D-ICs.
Data transfer to and from stacked dies takes place through TSVs integrated in the bottom die. These TSVs are physical pillars running vertically made up of conductive material such as copper. Bonding stacked dies into a single package instead of a multiple package on a PCB increases I/O density by 100x. The energy-per-bit transfer can be reduced to 30x with the latest technology.
This guide provides essential information for a successful multi-die design. It covers the advantages and motivating factors, as well as key considerations and guidelines for new projects.
With the slowing of Moore’s law, packing more functionality into a single die is not always the best way to develop the next generation of semiconductor devices. 3D-ICs offer a viable and valuable alternative, delivering at performance, power, and footprint benefits through the vertical stacking of silicon wafers or dies into a singly packaged device. Benefits include:
| Types of Package (2D/3D) | No of IOs/mm2 | Data Transfer Power (pJ/bit) |
|---|---|---|
| Wire Bond (2D) | <10 | 10 |
| Flip Chip Bump (2D) | <100 | 1.5 |
| Micro Bump (2D) | <1000 | 0.5 |
| TSVs (through-silicon vias) (3D | <10000 | 0.1 |
| Hybrid bond (3D) | Up to 1,000,000 | 0.05 |
3D-ICs are ideal for all kind of chips that target more transistors, less power, or small area. A multitude of different chip segments have different advantages from using 3D-IC technology and 3D-ICs are finding increasing acceptance in some of the most demanding semiconductor applications.
The compact footprint is valuable for mobile devices, internet of things (IoT) and other applications where space is at a premium. The capacity and flexibility are ideal for compute-intensive applications such as high-performance computing (HPC), data centers, cloud computing, artificial intelligence (AI), and machine learning (ML).
The chart below shows the growing segments benefiting from 3D-IC technology:
| 3DIC Benefits | |||||
| Segment | Less Power | High Performance | Smaller Size | More Memory | More Bandwidth |
| Mobile | ✔ | ✔ | ✔ | ||
| High Performance Compute | ✔ | ✔ | ✔ | ||
| AR/VR (XR) | ✔ | ✔ | ✔ | ✔ | ✔ |
| Artificial Intelligence | ✔ | ✔ | |||
| Networking | ✔ | ✔ | ✔ | ✔ | |
| IoT | ✔ | ✔ | |||
There are several multiphysics challenges in 3D-IC design, including heat transfer, electromigration, stress and strain, and thermal expansion. These challenges arise due to the complex and interconnected nature of 3D-ICs, in which multiple dies are stacked on top of each other and connected using TSVs and microbumps.
Thermal expansion is also a challenge in 3D-IC design. As the temperature of an IC changes, different materials used in the IC will expand at different rates, causing stresses and warpage that can affect its performance and reliability. Heat transfer can further complicate the temperature distribution in the 3D-IC design. Due to the high density of transistors and other components, heat transfer gets difficult in 3D-ICs. Most of the heat is trapped in the system, which contributes to the increased temperature. This phenomenon is called self-heating. The 3D-IC constitutes billions of components that are connected through long interconnect wires. Joule heating resulting from these long connections is another major problem area that contributes to overall temperature increase. These heat sources must be monitored and analyzed when designing 3D-ICs to ensure reliable performance.
3DIC Compiler
Synopsys 3DIC Compiler is the electronic design automation (EDA) industry’s only unified platform for end-to-end multi-die design and integration within one package. It provides a single graphical user environment with 3D visualization, supporting the exploration, design, implementation, validation, and signoff of 3D-ICs. It is built on the Synopsys Fusion Design Platform™ SoC-scale IC design common data model, providing scalability in capacity and performance. 3DIC Compiler enables hundreds of thousands of inter-die interconnects, which traditional IC packaging tools cannot deliver. It offers a full set of automated features along with power integrity, as well as thermal and noise-aware optimization that minimizes the number of design iterations.
Benefits of this technology include:
Synopsys IP
Designers are splitting SoCs into multiple dies to improve yield, PPA, and scalability for various use cases such as die splitting, die disaggregation, compute scaling and aggregation of functions. To meet the extensive die and SDRAM connectivity requirements for such multi-die SoCs, SoC designers are using Synopsys’ silicon-proven Synopsys Die-to-Die and HBM IP solutions. The solutions offer low-latency controllers and power-efficient PHYs available on the most advanced FinFET processes, supporting 2.5D or 3D packaging technologies. The die-to-die IP enables reliable 112G XSR and parallel-based HBI links, and the HBM IP allows up to 921 GB/s HBM3 SDRAMs.
The Industry’s Only Unified Exploration-to-Signoff Platform for 2.5D and 3D Multi-Die Designs