STAR Memory System

The DesignWare® Self-Test and Repair (STAR) Memory System™ is a comprehensive, integrated test, repair and diagnostics solution that supports repairable or non-repairable embedded memories across any foundry or process node. Silicon-proven in over a billion chips on a range of process nodes, the STAR Memory System is a cost-effective solution for improving test quality and repair of manufacturing faults found in advanced processes. The STAR Memory System's highly automated design implementation and diagnostic flow, including Silicon Browser and Yield Accelerator, enables SoC designers to achieve quick design closure and significantly improve time-to-market and time-to-yield in volume production.

The STAR Memory System includes optimized test algorithms specifically targeted at increasing coverage for memory defects like process variation and resistive faults that are prevalent at smaller process nodes, including 14/16-nm and 7-nm FinFET.

STAR Memory System Capabilities

SoC designers, silicon aggregators, and leading foundries targeting automotive, IoT, enterprise, and consumer applications licensed STAR Memory System with the added flexibility of consulting services for memory BIST planning, generation, insertion, and verification.

STAR Memory System Datasheet

Look Ma! No Hands! Test & Repair Requirements for Autonomous Vehicles

At ITC 2017, Joachim Kunkel discusses how advanced automotive semiconductors are being driven by ADAS & autonomous driving systems to move to smaller nodes. The presentation covers automotive test and repair requirements and solutions to help ensure automotive functional safety.

Joachim Kunkel
General Manager of the Solutions Group, Synopsys

Highlights

Automated testbench capabilities and proven validation flow for successful bring up of first silicon on automatic test equipment
Tight integration of memory with test and repair through STAR Memory System for minimal impact on timing and area, resulting in quick timing closure
Protection from multiple transient errors through ECC Compiler
Superior failures diagnostic capabilities such as physical failed bitmaps, XY coordinate identification and fault classification of failures reduces time-to-yield and time-to-volume
Supports Internet of Things (IoT) applications with industry's first commercial BIST solution for embedded flash
Certified to support the ISO 26262 ASIL-D standard for automotive functional safety