The DesignWare® Self-Test and Repair (STAR) Memory System™ is a comprehensive, integrated test, repair and diagnostics solution that supports repairable or non-repairable embedded memories across any foundry or process node. Silicon-proven in over a billion chips on a range of process nodes, the STAR Memory System is a cost-effective solution for improving test quality and repair of manufacturing faults found in advanced processes. The STAR Memory System's highly automated design implementation and diagnostic flow, including Silicon Browser and Yield Accelerator, enables SoC designers to achieve quick design closure and significantly improve time-to-market and time-to-yield in volume production.
The STAR Memory System includes optimized test algorithms specifically targeted at increasing coverage for memory defects like process variation and resistive faults that are prevalent at smaller process nodes, including 14/16-nm and 7-nm FinFET.
Synopsys asked its customers—design engineers, R&D managers, and more—to share their experiences using DesignWare Embedded Memories, Logic Libraries and STAR Memory System. Browse the survey results to read their comments, see statistics on their power, performance, area, and yield improvements, and review complete case studies.
For more information about STAR Memory System training courses, click here.
DesignWare STAR Memory System Capabilities
Look Ma! No Hands! Test & Repair Requirements for Autonomous Vehicles
At ITC 2017, Joachim Kunkel discusses how advanced automotive semiconductors are being driven by ADAS & autonomous driving systems to move to smaller nodes. The presentation covers automotive test and repair requirements and solutions to help ensure automotive functional safety.
Joachim Kunkel, General Manager of the Solutions Group, Synopsys