Synopsys 3DIO Solution IP is a specialized IO technology for fine‑pitch, hybrid‑bonded multi‑die integration. Designed to help SoC teams build advanced multi‑die architectures more efficiently, it delivers a scalable, low‑power, high‑bandwidth die‑to‑die interconnect that meets the growing demands of AI and advanced packaging.

Hybrid bonding enables ultra‑short vertical paths and fine interconnect pitches, providing higher bandwidth density and improved power efficiency without the need for complex analog signaling. Leveraging these advantages, Synopsys 3DIO uses a protocol‑free, fully digital architecture optimized for low power and low latency in heterogeneous 3D systems—addressing key limitations of traditional interconnect methods.

The solution includes two components: a flexible 3DIO cell for compact placement and synthesis, and a hardened, cluster‑based 3DIO PHY with integrated clocking, power delivery, and validated timing for scalable multi‑die systems. It supports ~4–6 Gb/s per lane at ultra‑low energy (<0.05 pJ/bit) and offers configurable redundancy, pre/post‑bond BIST, APB/JTAG management, source‑synchronous signaling, and integrated ESD and power delivery for easier implementation.

Synopsys 3DIO Solution IP is part of the broader Synopsys 3D ecosystem for Multi-Die Solutions, which also includes UCIe (PHY, Controller, VIP) and HBM3 IP. 

By leveraging Synopsys 3DIC Compiler, designers can accelerate time‑to‑market and improve power, performance, and area (PPA) while achieving predictable timing closure for fine‑pitch, hybrid‑bonded vertical connections.

Highlights & Features

  • Optimized for heterogeneous integration in 3D stacking
  • Enabling designers the flexibility & scalability to accelerate multi-die integration  
  • Optimal PPA architected to support 3D packages
  • Protocol‑free, fully digital die‑to‑die I/O optimized for fine‑pitch hybrid bonding
  • Supports ~4-6 Gb/s per lane with ultra‑low energy <0.05 pJ/bit
  • Hardened 3DIO‑PHY with modular 16‑lane TX/RX clusters
  • System level scaling via digital controller/wrapper
  • Integrated redundancy and pre/post‑bond BIST for robust yield and testability
  • Aligned with UCIe‑3D architectural principles
  • Compact integrated design for smallest power & area
  • Compatible with 3DIC Compiler for fast timing closure

 

Product Details


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