Complete Memory Test, Repair and Diagnostics Solution

TestMAX SMS is a comprehensive, integrated test, repair and diagnostics solution that supports repairable or nonrepairable embedded memories across foundry, process node and memory IP vendors. Its highly automated design implementation and diagnostic flow enables system-on-chip (SoC) designers to achieve quick design closure and significantly improve time-to-market and time-to-yield in volume production.

Key Benefits

  • Full RTL integration flow with TestMAX Manager
  • Hierarchical architecture and automated SoC integration and verification
  • High-quality test to provide full memory defect  coverage with minimum test time
  • High yield with efficient on-chip repair across  multiple operating corners
  • Superior diagnostics with physical failed bitmaps  and XY coordinate identification to quickly determine root cause of failures

Key Features

  • TestMAX SMS provides all the key elements for embedded memory test and repair utilizing the DesignWare® Self-Test and Repair (STAR) Memory System components: STAR Memory System wrapper, STAR Memory System processor, STAR Memory System server and sub-server, and MMB Processor for high performance cores
  • Test algorithm programmability
  • Tester patterns and diagnostics
  • Silicon bring-up and characterization