TestMAX Access IEEE 1687 and IEEE 1500 Automation Support

TestMAX Access

IEEE 1687 and IEEE 1500 Automation Support

Synopsys TestMAX Access leverages both IEEE 1500 and IEEE 1687 standards to provide a flexible test access infrastructure that is used to automate test integration and validation for testing system-on-chips (SoCs).

Key Benefits

  • Integration and verification of IJTAG network and IJTAG-compliant IP
  • Integration and verification of IEEE 1500 access network

Key Features

  • ICL extraction and verification
  • Hierarchical PDL pattern porting
  • Automated pattern porting and generation of tester-ready patterns in WGL/STIL/SVF and post-silicon failure diagnostics
IEEE 1687 and IEEE 1500 Automation Support
IEEE 1687 and IEEE 1500 Automation Support