Synopsys TestMAX Access leverages both IEEE 1500 and IEEE 1687 standards to provide a flexible test access infrastructure that is used to automate test integration and validation for testing system-on-chips (SoCs).
Integration and verification of IJTAG network and IJTAG-compliant IP
Integration and verification of IEEE 1500 access network
ICL extraction and verification
Hierarchical PDL pattern porting
Automated pattern porting and generation of tester-ready patterns in WGL/STIL/SVF and post-silicon failure diagnostics