Mastering AI Chip Complexity
Explore challenges and solutions in AI chip development
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IEEE 1687 and IEEE 1500 Automation Support
Synopsys TestMAX Access leverages both IEEE 1500 and IEEE 1687 standards to provide a flexible test access infrastructure that is used to automate test integration and validation for testing system-on-chips (SoCs).
Benefits
- Integration and verification of IJTAG network and IJTAG-compliant IP
- Integration and verification of IEEE 1500 access network
Features
- ICL extraction and verification
- Hierarchical PDL pattern porting
- Automated pattern porting and generation of tester-ready patterns in WGL/STIL/SVF and post-silicon failure diagnostics