Mastering AI Chip Complexity
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Actionable Insights Through Silicon Lifecycle Monitoring and Analytics
Synopsys integrated Silicon Lifecycle Management (SLM) family of products improves silicon health and operational metrics at every phase of the device lifecycle. Synopsys SLM family of products is built on a foundation of enriched in-chip observability, analytics and integrated automation. Monitors enable deep insights from silicon to system. Meaningful data is gathered at every opportunity for continuous analysis and actionable feedback.
Optimize Each Phase of the Device Lifecycle
In-Design
Monitor-Based Silicon Aware Optimization
In-Ramp
Product Ramp & Accurate Failure Analysis
In-Production
Volume Test & Quality Management
In-Field
Predictive Maintenance & Optimized Performance
Explore Synopsys Silicon Lifecycle Management Family of Products
Semiconductor design, manufacturing and system deployment are being challenged on many fronts due to process variability, device aging effects, ever increasing performance expectations, and the continued reduction in time to volume. Synopsys is leading the industry to solve these challenges with its SLM solution, a comprehensive set of integrated tools, IP and methodologies. SLM intelligently and efficiently collects and stores monitor data throughout a system’s life and provides actionable insights through the use of powerful analytics.
Synopsys SLM PVT Monitor IP has been certified by SGS-TÜV Saar as ASIL-B Ready and meets AEC-Q100 Grade 2 standard. IC and system developers using Synopsys SLM will reap huge benefits, including more efficient design and improved quality. Predictions of in-field chip degradation or failure are extremely valuable for end users by enabling corrective action before sudden and catastrophic system failures.
Synopsys SLM Family of Products
Learn more about the individual products within SLM
- In-Chip Monitor IP
- Product Analytics
- Intelligent Data Extraction and Communication
SLM Use Cases
SLM enables solutions to improve silicon health and operational metrics at every phase of the device lifecycle.
Silicon Characterization Based on Foundry Models
Characterize your silicon based on the expectations from the foundry model. Data from embedded monitors such as ring oscillators can be used to identify potential bottleneck cells or class of cells (e.g., specific Vt, drive strength, cell type, etc.) that are causing low margin and timing fails.
Correlation Improvement and Design Margin Reduction
Understand the manufacturing stability of advanced process nodes and validate how accurately the pre-silicon models can predict post-silicon parametric results. The calibration improves consistency between the behavior predicted by the design models and the actual performance of the hardware.
Optimize Yield Ahead of Production
Gain insights into in-silicon health, visibility, and insight at each stage of the semiconductor lifecycle. Sensors and monitors include ring oscillators and path margin monitors that enable gathering in-ramp silicon results, comparing and correlating these results to design targets, and producing insights that lead to data driven actions for design, fabrication, production test, and system level test.
Improve Correlation Between a Predicted and Measured Vmin
Improve the correlation between a predicted Vmin that comes from a model versus the measured Vmin. Silicon.da analytics solution enables the device to operate at lower power while still meeting the required performance by setting the device specific Vmin during testing on the test floor at the value of the predicted model.
Reliability, Availability, and Serviceability
Detect early silicon issues, perform remote in-system debug and diagnostic, and monitor degradation over time. SLM monitors and in-system scan test transform silicon health data into actionable insights, helping reduce failure rates across the system lifecycle and improving uptime, system longevity, and overall reliability.
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Silicon Lifecycle Management for Actionable Insights Across the Chip Lifespan
What Our Customers Are Saying
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Cisco: Enhancing ASIC Reliability and Observability with Synopsys (SLM) IPs
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Ensuring Testability of an Ultra Large Scale HBM-Based Multi-Die SoC for AI and HPC
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