TetraMAX® II is Synopsys’ next-generation ATPG and diagnostics solution that utilizes highly optimized, memory-efficient engines to generate high-coverage test patterns in hours instead of days. Learn more
about the groundbreaking technology that enables TetraMAX II to deliver order of magnitude faster pattern generation and significantly fewer patterns than any other solution.
Ensuring that complex SoCs meet manufacturing test requirements is a significant challenge. The Synopsys synthesis-based test solution maximizes productivity, providing designers, DFT engineers and product engineers with the fastest and most cost-effective path to high-quality manufacturing tests and high-volume silicon. Synthesis-based technology minimizes the impact test logic has on design timing, area, power and congestion. This eliminates time-consuming iterations between RTL synthesis, test and physical implementation, helping designers converge on both test and design goals faster. The test solution is comprised of SpyGlass® DFT ADV testability analysis; DFTMAX™ Ultra, DFTMAX, TetraMAX, and TetraMAX II for power-aware logic test and physical diagnostics; DFTMAX LogicBIST for in-system self-test; DesignWare® STAR Hierarchical System for IEEE standards-based hierarchical SoC test; DesignWare STAR Memory System® for embedded and external memory test, repair and diagnostics; DesignWare IP for high-speed interfaces with self-test; and Yield Explorer for design-centric yield analysis.