SpyGlass DFT ADV

RTL Testability Analysis and Improvement

SpyGlass® DFT ADV performs RTL testability analysis and improvement, enabling designers to fine-tune their RTL early in the design cycle to predictably meet their manufacturing and in-system test coverage goals. The tool’s extensive design-for-test (DFT) rule checking and RTL fault coverage estimation capabilities help designers pinpoint testability issues early in the flow (Figure 1) and thus avoid test bottlenecks downstream that can lead to time-consuming design iterations.

Features and Benefits

  • Shortens test implementation time and cost by ensuring RTL or netlist is scan-compliant
  • Improves test quality by diagnosing DFT issues early at RTL or netlist
  • Lint checking and analysis for DFT
  • RTL stuck-at and transition fault coverage estimation
  • Intuitive, integrated debug environment with cross-probing among views