International Test Conference (ITC)

Exhibit Hours

• Tuesday, October 13: 10:30 AM – 5:30 PM CT
• Wednesday, October 14: 9:30 AM – 4:30 PM CT
• Thursday, October 15: 9:30 AM – 1:30 PM CT

Live Demonstrations

See the latest advances in AI-driven test, silicon analytics, in-chip monitoring, and pre-silicon validation through interactive demonstrations at booth #302.

• AI-Driven Test Innovation: See how generative and agentic AI technologies help accelerate test development, improve productivity, and streamline complex test workflows.
• Advanced Test Optimization: Explore the latest TestMAX innovations for improving test quality, coverage, and efficiency while reducing test cost and time to results.
• ATPG Advances for Complex Designs: Learn about the newest advances in automatic test pattern generation (ATPG) for today's increasingly complex semiconductor designs.
• Memory Test and Repair: Discover solutions for comprehensive memory test, diagnosis, and repair that help improve quality and yield.
• Silicon Lifecycle Management IP: See how embedded monitoring and observability technologies provide critical silicon insights from bring-up through production and deployment.
• Silicon Analytics: Explore how silicon data can be transformed into actionable insights to improve quality, reliability, and operational efficiency throughout the silicon lifecycle.
• Pre-Silicon Validation Environment: Learn how pre-silicon validation capabilities help teams identify issues earlier, reduce risk, and accelerate time to silicon.

Let's Meet

Whether you want a quick chat to catch up or want to go deep on details, please reach out to us to schedule an on-site meeting.