Mastering AI Chip Complexity
Explore challenges and solutions in AI chip development
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Equipment Monitoring & Control
Overview
BISTel offers various state-of-the-art applications for equipment monitoring and process control to monitor the health of the equipment, identify root causes rapidly, optimize process flows and predict outcomes to mitigate risks in manufacturing.
Dynamic Fault Detection
Next-generation fault detection solution with full trace analysis and with enhanced productivity eliminating the need for timely and costly modeling.
eRMS
Equipment Recipe Management System(eRMS) maximizes equipment performance through effective recipe management and associated parameters, minimizes operator errors, and reduces costs.
eR2R
eR2R solution built on the proven PeakPerformance™ framework effectively utilizes process and measurement data of earlier runs to monitor and calculate recipe modifications automatically to ensure tighter process control.