MediaTek is pushing the boundaries of advanced SoC innovation across flagship mobile platforms and emerging automotive applications. As MediaTek advances high-performance XPU designs—including CPU, GPU, and NPU subsystems—SRAM robustness becomes increasingly critical because SRAM can occupy a large share of overall chip area and must support very different dynamic voltage and frequency scaling (DVFS) requirements across blocks. For leading-edge 2nm designs, this means yield qualification must be effective at both high-voltage, high-frequency operating conditions and ultra-low-voltage operating points optimized for power and leakage.
To make large-instance Monte Carlo analysis practical for 2nm XPU SRAMs, MediaTek deployed Synopsys High-Capacity Variation Analysis (HCVA) with PrimeSim XA. HCVA enabled full-instance-level statistical simulation with substantially lower memory usage and faster turnaround, while preserving accuracy against traditional Monte Carlo for failure signatures and timing distributions.
MediaTek validated HCVA on both a 128KB single-port SRAM instance and an 8KB double-pump SRAM instance. Accuracy was evaluated during the development phase—when design margins were still strained—using functional vectors that stressed internal design margins. HCVA matched the key failure signatures and timing-distribution behavior observed with traditional Monte Carlo.
| SRAM Instance | Metric | Traditional MC | HCVA | Impact |
| 128KB Single-Port | Runtime | 3 days, 1 hour | 1 day, 20 hours | 1.55X gain |
| Peak Virtual Memory | >256GB | ~37GB | 6.91X lower memory usage | |
| Accuracy | 3/300 experimental failures | 2/300 experimental failures | Meeting accuracy | |
| 8KB Double-Pump | Runtime | 1 day, 6 minutes | 19 hours, 41 minutes | 1.22X gain |
| Peak Virtual Memory | 6705MB | 1408MB | 4.76X lower memory usage | |
| Accuracy | 12/100 experimental failures | 9/100 experimental failures | Meeting accuracy |