Yield Management - Odyssey

Synopsys’ Odyssey product line consists of multiple components to satisfy the unique requirements of semiconductor wafer manufacturing. Odyssey Defect is a production-proven defect data management solution chosen by over thirty-five manufacturing sites worldwide.

Production-Centric Yield Management for Wafer Manufacturing

Synopsys’ Odyssey product line consists of multiple components to satisfy the unique requirements of semiconductor wafer manufacturing. Odyssey Defect is a production-proven defect data management solution chosen by over thirty-five manufacturing sites worldwide.

Odyssey is also a complete in-line Yield Management System that analyzes semiconductor production and test data in order to quickly identify tools and processes that impact yield. 

Odyssey Defect

Synopsys’ Odyssey product line consists of multiple components to satisfy the requirements of today’s modern semiconductor fabs. Odyssey Defect is a production-proven defect data management solution has helped over thirty-five manufacturing sites manage their defectivity issues. With over fourteen years of developmental history, Odyssey Defect provides real-time lot dispositioning, SPC alarming and a complete set of defect analysis tools to help fab engineers resolve both random and systematic yield issues. A true 24x7 system, Odyssey Defect delivers results efficiently and reliably, leveraging error-correcting processes to assure users of maximum up time. Odyssey Defect has an open and vendor-neutral architecture that supports all inspection, review and classification tools with a full range of interactive charting, wafer mapping and reporting capabilities.

  • Easy-to-use native Odyssey GUI enables high productivity of manufacturing personnel
  • Tool neutral, with all inspection and review tools supported equally. Automates in-line defect analysis to reduce diagnosis cycle times
  • Best-in-class functionality includes easy to create and maintain analysis templates, which can be shared across the fab and triggered by fab yield excursions
  • Real-time, server-based defect source analysis (DSA) , SPC functions and automatic wafer sampling and export (dispositioning)
  • Interactive spreadsheets and maps permit drill down to problem sources in minimal time
  • Stable ORACLE database and highly reliable product with low maintenance support for 24x7 fab operation
  • Integrated automation features allow users to collaborate faster to address root cause analysis in minutes (not days!)
  • Now available on LINUX.
Odyssey Defect