Cloud native EDA tools & pre-optimized hardware platforms
Odyssey is also a complete in-line Yield Management System that analyzes semiconductor production and test data in order to quickly identify tools and processes that impact yield.
Synopsys’ Odyssey product line consists of multiple components to satisfy the requirements of today’s modern semiconductor fabs. Odyssey Defect is a production-proven defect data management solution has helped over thirty-five manufacturing sites manage their defectivity issues. With over fourteen years of developmental history, Odyssey Defect provides real-time lot dispositioning, SPC alarming and a complete set of defect analysis tools to help fab engineers resolve both random and systematic yield issues. A true 24x7 system, Odyssey Defect delivers results efficiently and reliably, leveraging error-correcting processes to assure users of maximum up time. Odyssey Defect has an open and vendor-neutral architecture that supports all inspection, review and classification tools with a full range of interactive charting, wafer mapping and reporting capabilities.