VC SpyGlass Lint: Early, Automated Detection of Design Issues

Modern chip designs often encounter a range of errors, from inefficient RTL coding to complex bugs that only appear during real-world testing. Detecting these issues early is crucial, as fixing bugs becomes increasingly costly at later development stages. Functional verification and RTL signoff both play vital roles in ensuring chip quality.

This whitepaper explains how early linting—specifically with Synopsys VC SpyGlass Lint—helps catch and address design issues early, and how integrating Synopsys tools like VCS and VC SpyGlass benefits the verification process.

You will learn:

• Types of functional and structural errors that impact chip quality
• The value of early bug detection in reducing costs and improving outcomes
• Differences between functional signoff and RTL signoff
• How Synopsys VC SpyGlass Lint identifies RTL issues early
• Key benefits of using Synopsys’s verification tool portfolio