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Synopsys High-Speed Test IO IP Datasheet
Access the Synopsys High‑Speed Test IO IP Datasheet and discover how high‑bandwidth, multiplexed test IO—optimized for TSMC N3—streamlines chiplet‑based AI and HPC testing while maximizing pin efficiency.
What You Will Learn:
- How high‑speed single‑ended IO (up to 2.5Gbps) improves test throughput, enables clock observation, and reuses limited package pins efficiently.
- How multiplexed modes simplify testing by combining test‑port, debug‑clock, and GPIO functions with no calibration or protocol overhead.
- How flexible placement, low‑power GPIO mode, and BIST/scan‑test support help achieve faster validation, higher yield, and reliable multi‑die integration.
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