Shift Left Verification with Comprehensive Lint Signoff

This whitepaper addresses the growing challenges of efficient and predictable design closure in the face of increasing chip complexity and size. It explores how early static verification—specifically advanced linting—can accelerate design cycles and improve overall design quality. The paper highlights the role of VC SpyGlass Lint in enabling early detection of RTL issues, which contributes to faster time-to-market and fewer costly errors downstream.

You will learn:

• The benefits of early, “shift left” verification in chip design.
• The role of linting as the first step in static verification to catch RTL bugs early.
• How early linting improves efficiency in later stages like simulation and synthesis.
• The advancements in linting tools for detecting problematic coding styles.
• How VC SpyGlass Lint enables early detection of design issues for a smoother, faster design process.