Victor is a Synopsys fellow, engaged in a variety of projects on modeling design-technology co-optimization, FinFETs, gate-all-around transistors, stress engineering, 3D ICs, transistor scaling, cryogenic devices, middle-of-line and back-end-of-line resistance and capacitance, solar cell design, innovative patterning, random and systematic variability, junction leakage, non-Si transistors and atomistic effects in layer growth and doping. Several facets of this activity are reflected in three book chapters, more than 100 technical papers, and over 300 U.S. and international patents. Victor has been involved in technical committees at ITRS, IEDM, SISPAD, DFM&Y, ECS, IRPS, EDTM, and ESSDERC, including having served as a technical chair of SISPAD in 2018 and his current role as editor of IEEE Electron Device Letters.
Closing this window clears your chat history and ends your session. Are you sure you want to end this chat?
NOTICE: You are interacting with an AI-powered chatbot that provides general information about Synopsys, including its products and services, which may be incorrect or incomplete. In the event of any conflict or discrepancy, the terms of your applicable agreements supersede any information provided by this chatbot. These chats may be accessed by Synopsys and its service providers to customize the experience and improve this tool, and your use of this chatbot is an agreement to that data processing activity.