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Yield Management
Intelligent and Adaptive Process Control
Semiconductor IC production is a complex process, starting with the design of a new chip, through the stringent fabrication, and ending with product test and distribution.
The data analysis required to monitor and enhance yield is a huge challenge, especially as data volume and diversity grows with shrinking technology nodes. Product-specific design-process-test interactions have further complicated the path to root cause identification, making it harder for engineers to develop a clear understanding of the nature of yield limiters.
Synopsys products address these complicated analysis requirements with product capabilities tuned for specific use cases. Synopsys yield management products enable intelligent and adaptive process control to better detect, analyze, and predict process variations to drive manufacturing excellence, and reduce production costs.
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