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Yield Management
Enabling Faster Process and Product Ramp-Up
Semiconductor IC production is an inherently complex flow, starting with the design of a new chip, through the stringent manufacturing process, and ending with product test and distribution.
The data analysis required to monitor and enhance yield is a huge challenge, especially as data volumes grow large and diverse with shrinking technology nodes.
Product-specific design-process-test interactions have further complicated the path to root cause identification, making it harder for engineers to develop a clear understanding of the nature of yield limiters. Synopsys products address these complicated analysis requirements with product capabilities tuned for specific user groups.