Radiation Tolerance is not just for Rocket Scientists: Mitigating Digital Logic Soft Errors in the Terrestrial Environment White Paper

As technology scales to smaller geometries, soft errors from particle radiation are no longer just a space-industry concern — they're a growing reliability challenge for every SoC designer. With more elements packed into today's chips, SRAMs, sequential elements, and combinational logic are all susceptible to SEUs, increasing the SER in high-reliability applications like automotive and datacenter.

What You Will Learn:

• The types and sources of radiation particles that impact circuit-level Soft Error Rates
• Techniques to mitigate terrestrial radiation effects in SoC designs for automotive and datacenter applications
• How technology scaling from planar to FinFET impacts SoC reliability due to SER
• How logic libraries can be SEU-optimized while still meeting stringent PPA requirements