Improving Scan Test Coverage for Automotive Grade Mixed Signal IP

Discover how the automotive industry is tackling the challenges of complex and safety-critical systems with cutting-edge solutions. This white paper dives into system on chip (SoC) development, where increasing demands for safety and reliability push the boundaries of design for test (DFT) methodologies.

Learn about innovative strategies to boost test coverage and ensure top-notch quality in automotive-grade designs. Synopsys leads the way with smart, effective solutions that meet the highest safety standards, making sure your tech is not just functional, but exceptional. Get ready to explore the future of automotive safety and innovation!