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Assessing ESD Sensitivity of Interface IP Using Charged Device Model White Paper
Electrostatic discharge (ESD) poses a significant risk to electronic devices throughout manufacturing and operation, making accurate assessment of ESD sensitivity critical for reliable design. This white paper will discuss the Charged Device Model (CDM), its role in evaluating ESD robustness, and methods for assessing interface IP performance using peak current measurements rather than traditional voltage-based metrics.
What You Will Learn:
- The fundamentals of CDM and how it differs from other ESD models such as HBM
- Why peak current is a more reliable metric than voltage for assessing ESD sensitivity at the IP level
- Methods for qualifying and correlating CDM performance from test chips to final products
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