Although standard transition delay testing improves defect coverage beyond levels stuck-at patterns alone can achieve, the methodology is limited in its ability to reach the test quality levels required for the latest generation of designs. In response, an improved delay test methodology, slack-based transition delay (SBTD), is being deployed by Synopsys customers as a means to achieve even higher defect coverage than standard transition delay. This white paper describes the basic principles related to SBTD, which is available in Synopsys' synthesis-based test solution, DFTMAX and TetraMAX ATPG.
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