The DesignWare® Self-Test and Repair (STAR) Memory System is a comprehensive, integrated test, repair and diagnostics solution that supports repairable or non-repairable embedded memories across any foundry or process node. Silicon-proven in over a billion chips on a range of process nodes, the STAR Memory System® is a cost-effective solution for improving test quality and repair of manufacturing faults found in advanced processes. The STAR Memory System's highly automated design implementation and diagnostic flow enables SoC designers to achieve quick design closure and significantly improve time-to-market and time-to-yield in volume production.
The newest version of the STAR Memory System is built on a new architecture and includes optimized test algorithms specifically targeted at increasing coverage for memory defects like process variation and resistive faults that are prevalent at 20-nm processes and below. To learn more about these new features, click here.
For more information about STAR Memory System training courses, click here.
DesignWare STAR Silicon Browser IP for Embedded Memory Test and Repair This demonstration will feature the post-silicon interactive automation capabilities of the DesignWare' STAR Silicon Browser, which utilizes the DesignWare STAR Memory System's embedded test & repair IP solution.