Cloud native EDA tools & pre-optimized hardware platforms
SLM Production Analytics is a unique analytics solution spanning design and product manufacturing phases as part of the Synopsys Silicon Lifecycle Management (SLM) family. The solution automatically highlights silicon data outliers, enabling engineering teams to quickly identify and correct underlying issues in the semiconductor supply chain. SLM Production Analytics boosts productivity by consolidating analytics across all manufacturing phases within a single environment while able to process and analyze orders of magnitude more silicon data compared to other approaches.
With SLM Production Analytics, engineering teams can leverage silicon design, monitor, diagnostic, fab and production test data to quickly determine how to improve key chip production metrics such as quality, yield and throughput, while also improving key silicon operational metrics such as chip power and performance. Optimizing for both power and performance is made possible through an automated and massively integrated solution comprised of intelligent monitors and comprehensive analytics. The monitors that are key building blocks of power and performance optimization are: Process, Voltage and Temperature (PVT) and the very unique Path Margin Monitor (PMM). Silicon data collected by these monitors are used to improve accuracy of pre-silicon models which can significantly reduce power during design stage by eliminating unneeded guard bands and derates.
The benefits of SLM Production Analytics span three key focus areas: Productivity, Efficiency and Scalability.
Most data today is either unused by engineers due to the massive amount or lack of automation on where to look for issues within this data. With SLM Production Analytics, engineers are now able to gain instant value from all data integrated into one solution. Automated analysis and identification of issues or key points of interest is shown in the form of insights. Part-level traceability and debug enables quick root cause analysis along with corrective action back into the supply chain. Sub-die analysis is also available in early NPI product stage to identify systematic issues for failure analysis that are preventing high yield and high-volume production.
Chip power and performance optimization is made possible by the inclusion of monitors into the design enabling feedback of the monitor data for performing design calibration. An automated recipe flow for quality optimization containing outlier detection techniques is provided during production control back into the manufacturing supply chain. Comprehensive yield optimization is enabled by combining yield trend analysis, diagnostics and failure analysis with improvements made back into the design and/or process. OEE analysis of the tester fleet enables throughput optimization of the chip production. Real-time data collection & production control is provided for ultra fast latency of correcting issues resulting in cost savings and preventing quality escapes.
The enhanced product architecture accommodates petabytes of data across the full breadth of data types including design, monitor, diagnostic, fab and production test which most analytics tools cannot process either this breadth or depth of data. Having a solution able to handle massive amounts of data becomes crucial for performing timely root cause analysis especially when debugging silicon chip issues further downstream in manufacturing or debugging RMAs (return merchandise authorization) or performing historical analysis. Also, having the flexibility to provide users an option for processing and storing their data on the cloud is critical.