This structure is composed of three segments, all of which are defined using the same base TN anisotropic material. The crystal axis of this material is rotated around the Z axis to produce the TN structure, and is matched between the segments to create a uniform material. The crystal axis of each segment is rotated around the Z axis (Psi) as follows:
- Input Segment (bottom red)
This segment is defined via the TN material with a constant Crystal Axis orientation (Psi = 0 degrees).
- TN Segment (dark blue)
This segment is defined via the TN material with a linearly tapered Crystal Axis orientation (0 → Psi → 90). Later, we will study the transmission of the device as a function of the length of this segment.
- Output Segment (top red)
This segment is defined via the TN material with a constant Crystal Axis orientation (Psi = 90 degrees).
The excitation field is a TE planewave with a wavelength of 0.6328μm. Our aim is to measure the transmitted power in the TE field after it passes through the TN segment. We can realize this by using a monitor to measure the Ex field at the end of the middle twisted segment, and a metric in RSoft's MOST™ to calculate the power.