Cloud native EDA tools & pre-optimized hardware platforms
High-quality graphics are required to accurately present simulation results in publications and presentations. WinPLOT, the plotting program included with all RSoft™ products, has a complete set of options that can be used to customize how you display data. We have illustrated how to use WinPLOT to create high-quality line plot in the previous enews. In this note, we will illustrate how to make high quality contour plots. We will use the same nano-scale structured color example to show the options that can be used to customize contour plots; future notes will discuss other types of plots and options. You can access the design files on SolvNetPlus (account required).
A contour map of the field in the structure can be produced with the spatial field output feature of DiffractMOD™ (RCWA). The plot shown in Fig 1a was produced using an aspect ratio of 1 and a structure outline. However, quite frequently, users need to customize the plot in different ways. We have previously learned that we can go to the View Editor tab in WinPLOT and modify the commands according to our needs. If we replace the old ones with the commands in Table1, we will get the plot shown in Fig.1b.
Fig. 1: (a) Amplitude distribution of magnetic field
(b) Intensity distribution of magnetic field
Table 1: Modified WinPLOT Commands
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*We created the custom structure outline shown in Fig1b. The contents of this text file (fig1_custom.pda) are:
fill 0
color 15
style 1
width 3
line -0.09 0 -0.025 0
line -0.025 0 -0.025 0.17
line -0.025 0.17 0.025 0.17
line 0.025 0.17 0.025 0
line 0.025 0 0.09 0
Please refer to section 9.B. of the WinPLOT manual for more details about using RSoft drawing files.
We can also simulate the angle-resolved reflection spectral contour plots at different periods. Fig. 2 is obtained by a MOST™ scan vs. wavelength and internal incident angle scan in DiffractMOD. To display the results, the plot commands are modified using the ones in Table 2.
Fig. 2: Angle resolved reflection spectra at P=140nm
Table 2: Modified WinPLOT Commands for Angle-Resolved Reflection Spectra
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We also can use WinPLOT to display multiple plots together. The following is a set of 4 plots corresponding to 4 periods of the above angle-resolved reflection spectra.
Fig. 3: Angle resolved reflection spectra at P=140nm, 180nm, 220nm, 260nm
The following WinPLOT commands are used to plot the above figure:
Table 3: WinPLOT Commands for Displaying Multiple Plots Together
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Please note that when displaying multiple plots together, you should put all these plots (.pcs files) in the same location.
There are many more WinPLOT commands that can be used to modify contour plots. Please consult the WinPLOT user guide or contact the RSoft Technical Support team at rsoft_support@synopsys.com for more information.
References
[1,2] Yi-Kuei Ryan Wu et al, “Angle-Insensitive Structural Colours based on Metallic Nanocavities and Coloured Pixels beyond the Diffraction Limit,” Scientific Reports, 3 (2013).
These webinars are now available in the RSoft section on the Customer Portal.
In this 25-minute recording, learn about a mixed-level methodology that unifies the use of EM wave-level (RSoft) and ray-level (LightTools®) tools. The approach uses the RSoft products to characterize micro/nano-structured surfaces and include coherent effects in a LightTools simulation, such as scattering due to sub-wavelength structures, diffraction, and polarization.
View this 30-minute recording to learn about how high-speed, polarization-diversity systems yield spectrally efficient data transmission over longer distances. During the webinar, modeling options available in OptSim for PM-QPSK and PM-mQAM transmitters, receivers and digital signal processing used in coherent transmission were demonstrated.