CODE V Enewsletter

June 2015

Quick Tip: Fitting a Surface to a Set of Sag Data

Occasionally, you might need to take measured sag data and fit a surface in CODE V to this data. The data could be profilometer data from a fabricated part to look for fab errors, or data from a cockpit or automotive windshield that does not have a typical surface profile. Recently a set of macros has been improved to aid you in using CODE V for this task.

The process is pretty simple and utilizes the flexibility of the CODE V optimizer. A dummy system is set up as shown below for the purpose of measuring the optical path between a reference surface and a fitting surface. A custom user defined error function is created that defines the distance (using OP) between the surfaces at many different heights as aberrations. The target values for these aberrations are set to match the sag values from a data file, so that when optimized, the fitted surface should match the sag data (given sufficient degrees of freedom).

It is up to the user to decide what type of surface to fit, and which parameters can be varied. Below is a typical example where an asphere has some residual surface ripple due to the manufacturing process, which can be seen by fitting the data to a QBF surface type, using the desired aspheric orders.

More information can be found on our Customer Portal. If you have any other questions, please contact us at ora_support@synopsys.com.

2015 CODE V User Group Meetings Presentations Available on the Customer Portal

In June, Synopsys' Optical Solutions Group hosted a CODE V user group meeting featuring presentation topics ranging from CODE V case studies and usage tips to what’s new in the software.

If you weren't able to attend the meeting, we've uploaded the presentations to the Customer Portal so you can benefit from this year's topics. When you log in, you'll find the following presentations:

  • New Features in CODE V 10.7
    Learn about the new capabilities introduced in CODE V 10.7. New features include an object angle mapping for IMS, aspect ratio and tolerance sensitivity optimization constraints, and charting improvements.

  • Designing a Manufacturable Multifocal (“Zoom”) Lens
    In this presentation, a case study of a Multifocal ("Zoom") Lens is presented to demonstrate CODE V tools to improve manufacturability.

  • CODE V Tips and Tricks
    This presentation includes tips on obtaining simulated images based on desired image or detector size, optimizing variables with a specified step size, charting tips, using user-defined probability density functions for Monte Carlo analysis, applications for user-defined surface properties, creating animations on CODE V plots, and tips on searching the CODE V Electronic Document Library. Supporting macros and files for this presentation can be downloaded here.

  • CODE V Frequently Asked Questions
    This presentation covers a variety of topics frequently handled during CODE V tech support. Topics include interferograms, optimization of aspheres, and calculation of focal length and F/# in CODE V. Supporting macros and files for this presentation can be downloaded here.

  • Stray Light Analysis of a Cell Phone Lens: A Case Study
    This presentation covers the stray light analysis of a cell phone lens, using both CODE V and LightTools. 

  • Engineering Talk: Tolerance Eigenmode Analysis
    The Synopsys CODE V Engineering presentation introduces a method to select tolerancing compensators using eigenmode analysis.

CODE V Glass Catalog Updates Available for Download

Updates to the CODE V glass catalog, including the CDGM, Hikari, Hoya, and Ohara manufacturers' catalogs, are now available for download from http://www.synopsys.com/optical-solutions/support/support-glass-catalog.html. In addition to download links, we have included details about the glasses affected by this update and installation instructions