CODE V Enewsletter

September 2018

In This Issue:

• New Features in CODE V 11.2
• Register for Advanced CODE V Training

SpecBuilder & SpecEvaluator Enhancements

• The interface has been upgraded to make it easier to insert multiple specifications and to replicate an existing specification over zoom, field, defocus position, etc.
• User-defined specifications can now return a string value to the SpecBuilder.
• New built-in specifications have been added for Energy on a Detector, Encircled Energy Diameter (PSF-based), and Strehl Ratio (PSF-based).

Lens Data Manager Improvements

• CODE V now supports the encryption of multilayer coating files (can be used like a standard coating file, but the details of the coating prescription cannot be seen).
  
• A new user-defined surface for the Forbes Freeform (2DQ) is available in the CV_UMR folder.
  
• Special surfaces (SPS types) that accept a normalization radius now support the input of the normalization radius value as part of the initial surface definition. This is useful for converting surfaces and improving the import speed of lens sequence files.
• Mitsubishi plastic materials have been added to plastic private catalog macro PLASTICPRV.SEQ (Tools > Macro Manager … Sample Macros > Materials Information).

Optimization Enhancements (AUT)

• Several mechanical constraints now accept an optional overage scale factor and offset to define the physical edge more accurately. These include constraints on center thickness (CT), Edge Thickness (ET), Semi-Diameter (SD), Image Clearance (IMC), and Aspect-ratio (ATC & ATE). 
  
• The user interface for insert specific constraints has been significantly improved.

Visualize Apertures (VAP)

• The View Apertures option allows you to view individual aperture components or composite apertures on any surface. It can be launched from the CODE V menu, the Surface Properties Aperture page, or the Aperture Review. The cursor location on the plot will display the X and Y values in the surface coordinate system (this has also been enabled for Footprint plots and Biocular Field of View plots).

Asphere Writer

• The COM utility, Asphere Writer, is available in the Fabrication menu. It is used to write machine-readable files for aspheric surfaces that can be directly read by QED Technologies’ optical grinding/polishing/metrology equipment (QODIF file format), or Zygo Corporation's metrology equipment (.ASJ file format).

Enclosed Energy Calculations via Macro-PLUS Enhancements

• The new ENCLOSED_ENERGY() function computes the size of the user-specified enclosing shape that encloses specified percentages of energy (the energy information is stored in a macro array).
• The new ENERGY_ON_DETECTOR() function computes the percent energy enclosed by a circle, ellipse, square, or rectangle of a user-specified size (the energy information is stored in a macro array).
  
• The new BUFFER_TO_ARRAY() macro function transfers buffer data into a Macro array variable, and is especially useful for transferring energy data from PSF, BSP, or LUM into an array for use with the ENCLOSED_ENERGY() or ENERGY_ON_DETECTOR() functions. There is also a new ARRAY_TO_BUFFER() function.
  
• The new REVERSE_SYSTEM.SEQ macro will reverse the system end-for-end (i.e., image becomes the new object, and the object is now the image), and will work robustly for systems that have tilts and decenters.
  
• The new macro EVALUATE_ENCLOSED_ENERGY.SEQ uses the new enclosed energy macro functions to compute and chart the size of an enclosing shape as a function of percent energy enclosed.

New Supplied Macro for Robust System Reversal

• The new REVERSE_SYSTEM.SEQ macro (Tools > Macro Manager … Sample Macros > Utilities) will reverse the system end-for-end (i.e., image becomes the new object, and the object is now the image), and will work robustly for systems that have tilts and decenters.

CODE V Database Enhancements

• The GUI interface for inserting an off-the-shelf catalog lens has been improved to make it easier to insert several lenses consecutively.
  
• The Qioptiq off-the-shelf catalog was added (it replaces the Linos catalog), and the Edmund Optics catalog has been updated.
  
• The CDGM, Hoya, and Ohara catalogs have been updated to the latest available vendor information.
  
• The measurement temperature for Hikari dispersion data has been set to 23⁰ C.
  
• Additional +20⁰/+40⁰ C dN/dT information has been included in the database for Hoya glasses.