CODE V Enewsletter

MTF_1FLD Enhancements

Using the MTF_1FLD function, you can now compute MTF at nominal focus or through-focus positions that you define using the through-focus commands NFO, FFO, and IFO. MTF_1FLD is now thread safe, which allows for parallel processing during optimization.

Enhanced Visualization of Small Lenses

Display Lens (VIE) and Draw Lens (DRA & AUT;DRA) use new separate computations for very small diameter lenses (such as those in cell phones) that improve visualization of a lens layout.

CODE V Database Updates

• Off-the-shelf Catalog Lens Database has a new interface that makes it easier to find and select a catalog lens.
• New asphericon lens catalog and updated lens catalogs for Edmund Optics, Rochester Precision Optics, and Ross Optical.
• New Nikon glass catalog and updated glass catalogs for CDGM, Hikari, NHG, Ohara, and Schott.
• New catalog search order syntax lets you include a catalog identifier and a new CSO database item stores the catalog search order, which can be queried.
• Updated Test Plate Database contains new and updated test plates that can be used in optimization.
• The system temperature default has been changed to match the measurement temperature for Schott glass (22° C).

Macro-PLUS Enhancements

• New Macro-PLUS command, Clear Command Window (CCW), clears all text currently displayed in the Command Window. The CCW command can be used in the command line and in macros.
• User Tolerancing macros, TOLMONTE and TOLFDIF, allow you to tolerance on any performance metric that CODE V can compute. Several bug fixes and improvements were made for scenarios where you need to evaluate multiple performance metrics at once simultaneously.
• A new supplied macro, THG_TO_GRIN.SEQ, converts all thermal gradient surfaces (THG) in the current lens into equivalent aspheric surfaces (ASP) and creates a URN gradient index glass for each element.
• DNDTCALC macro has been updated to calculate absolute dn/dT values for any glass that has vendor-supplied dn/dT formula coefficients.
• ILREVERS has been updated to provide support for systems with user-defined reference ray aiming commands (CRA/RRA, over field, wavelength, and all reference rays). It also now supports systems with a negative thickness preceding the image plane and will change the sign for BEN-type fold mirrors with ADE (alpha) tilts.
• New SAGFIT2ZRN.SEQ replaces UDSFIT.SEQ. SAGFIT2ZRN converts a designated surface to a sixth-order Zernike polynomial surface (SPS ZRN) fitting user-specified sag data stored in a file.