Cloud native EDA tools & pre-optimized hardware platforms
CODE V’s Field Map Analysis (FMA) option helps you analyze various metrics such as distortion and RMS wavefront error over a 1D or 2D field. In addition, using wavefront polynomial coefficients, FMA can help you analyze nodal aberrations in your model, which can be used to gain insight into freeform surface designs.
Consider the following unobscured camera lens, designed with two freeform mirrors:
Using FMA, we can analyze the astigmatism and coma in this starting system to gain insight into the nodal aberrations present, as shown in the following figure.
In the case of astigmatism (scale of 1.7 waves), binodal astigmatism is present and in the case of coma (scale of 0.51 waves), the coma is asymmetric.
To run this analysis in FMA, choose the Analysis > Diagnostics > Field Map menu. In the Field Map dialog box, choose the Wavefront Polynomial coef. performance metric on the Field Display tab.
On the Computation tab, choose the wavefront coefficient numbers you’d like to analyze. These are either the coefficients of the standard Zernike polynomial, or Fringe Zernike polynomial. For instance, choosing the Fringe Zernike polynomial coefficient 9 would analyze the 3rd-order spherical aberration over the field.
In the case of astigmatism and coma, there are paired terms with an X and a Y component. In FMA, paired terms are coupled by default. Coefficient 5 is coupled with coefficient 6 for astigmatism, and coefficient 7 is coupled with coefficient 8 for coma. When you want to analyze these paired terms, enter one of the coefficient numbers, and FMA knows which terms to couple automatically.
Taking this analysis of the nodal aberrations a step further, it is possible in CODE V to optimize these freeform surfaces so that the residual aberrations could be corrected by additional rotationally symmetric optics. Using these optimization methods to control astigmatism and coma by constraining their Zernike terms, the astigmatism (scale is 0.87 waves) and coma (scale is 0.66 waves) are:
For more information about these optimization techniques, download the Q-Freeform UD1 Technical Information documentation found on the Customer Support Portal.
Current users of CODE V are invited to attend this one-day meeting. The CODE V User Group will be presented in three locations, and as a 3-part webinar series.
The live meetings start at 9:00 a.m. and end at 4:30 p.m. Complimentary lunch, as well as morning and afternoon refreshments, will be provided.
The following topics are planned for the day. Questions and discussion will be encouraged throughout the day.
Tuesday, June 5, 2018
Synopsys, Inc.
Palomar Room
199 S. Los Robles Ave., Suite 400
Pasadena, CA 91101
Tuesday, June 12, 2018
DoubleTree by Hilton Rochester
1111 Jefferson Road
Rochester, NY 14623
Tuesday, June 19, 2018
Synopsys, Inc.
Building A, Elements Room
690 E. Middlefield Road
Mountain View, CA 9404
10:30 a.m. - 12:00 p.m. PDT
10:30 a.m. - 12:00 p.m. PDT
10:30 a.m. - 12:00 p.m. PDT
You can also send your information (name, company, etc.) to us by email (codev_support@synopsys.com) or by telephone (626) 795-9101.
Wednesday, August 22, 2018
12:00 – 2:00 p.m.
Marriott Marquis San Diego Marina
Bayside Pavilion Room
333 W Harbor Dr.
San Diego, CA 92101
Synopsys' Optical Solutions Group cordially invites you to a luncheon reception at the SPIE Optics + Photonics conference in San Diego, CA. Join us for food and drinks, talk with our CODE V experts, share ideas with other users, and learn about our latest software innovations.
In addition, Donald O'Shea, Professor Emeritus of Georgia Institute of Technology, and Julie Bentley, Associate Professor of Optics at University of Rochester, will be available to sign copies of their new book to be published by SPIE Press, "Designing Optics Using CODE V." The book demonstrates how to design optical systems using CODE V, from lens definition to the description and evaluation of lens errors and onto the improvement of lens performance.
Please RSVP before August 15 if you plan to attend the reception. We hope to see you there!