Why Attend

The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in the test, validation, yield, reliability, and security of microelectronic circuits and systems.

The program includes keynotes, scientific paper presentations, short industrial application paper presentations, special sessions, and Innovative Practices sessions.

 

Who Should Attend

Engineers Focused on Safety & Reliability

Engineers Focused on Security Systems

Engineers Designing Large Scale Systems

Synopsys Sessions

Monday, April 25, 2022

8:20 - 9:00 AM

Plenary Keynote: Yervant Zorian, Synopsys, Inc.

9:20 - 9:40 AM

Regular Session: 

Novel Technique for Manufacturing & In-system Testing of Large Scale SoC using Functional Protocol Based High-Speed I/O 

9:20 - 9:40 AM 

Special Session: 

The Heterogenous Integrated Product Testability Best-Known Methods:  A Practitioner’s Guide to Building Manufacturable Products with Chiplets

9:20 - 10:20 AM

IP Session: 

High Speed Scan Fabric  

10:20 - 11:20 AM

Special Session:  

Deep Dive into Silicon Lifecycle Management: Challenges and Solutions  

12:10 - 1:00 PM

Plenary Session: 

Scan evolution (Remembrance of Tom Williams)    

Tuesday, April 26, 2022

9:00 -10:00 AM

IP Session: 

Test of 3D IC's

Wednesday, April 27, 2022

7:00 -8:00 AM

IP Session:

What's Next for Automotive: Where and How to Improve In-Field Test and Enhance SoC Safety 

Learn More and Register to Attend