DFTMAX Ultra

Compression for Highest Test Quality and Lowest Test Cost

DFTMAX Ultra addresses the most demanding test quality and test cost requirements with innovative synthesis-based technology that enables higher compression and faster test frequencies using fewer test pins. Encapsulated in Synopsys’ Galaxy Implementation Platform, DFTMAX Ultra works seamlessly with TetraMAX ATPG to predictably achieve high defect coverage and accurate fault diagnostics without adversely impacting design goals and schedules. 

Benefits

  • Significantly lowers manufacturing test costs
  • Enables higher defect coverage of silicon parts
  • Utilizes the maximum performance of tester equipment to further reduce test time/cost
  • Minimizes the required number of scan I/O for pin-limited testing
  • Provides simplified and fast test implementation
DFTMAX Ultra improves TATR/TDVR by 2-3X compared with standard low pin count architectures.

DFTMAX Ultra improves TATR/TDVR by 2-3x compared with standard low pin count architectures. Each design shown uses a single scan channel for compression