Roberto Gonella earned degrees in Electronic Engineering from Politecnico of Turin (I) and Institut National Polytechnique of Grenoble (F). He joined STMicroelectronics, Crolles, France in 1996, where he worked on advanced interconnect reliability and latch-up characterization in the R&D Reliability Department. Since 2001 Roberto has been part of the R&D Process Development team, where he was first in charge of interconnect development, then, starting in 2006, continuously responsible for yield ramp-up of advanced CMOS nodes and their derivative technologies. Since his appointment as Director of Technology Development in 2015, Roberto has extended his responsibility to the technology modelling team. The main domains of his expertise are in the fields of yield and statistical analysis, fault segregation, test and diagnostics, semiconductor physics, and technology development.