Synopsys at ITC 2017

Synopsys SIG ITC 2017

In the video below, recorded at the 25th Annual Test SIG Event at ITC 2017, NVIDIA Distinguished Engineer, Jon Colburn describes current automotive and AI test applications and the Synopsys Test solution, the preferred test platform for automotive designs. 

Please check back soon for more presentations.

 

An Overview of NVIDIA’s Innovations in Automotive and AI

Hear about NVIDIA’s advances in the AI and Automotive  SoC spaces.

Jonathon E. Colburn, NVIDIA