International Test Conference 2019

Washington, DC

Synopsys 27th Annual Test Special Interest Group (SIG) Event

Synopsys customers are invited to attend our 27th Annual Test SIG event at the International Test Conference (ITC) 2019. This year’s agenda includes presentations from leading companies, which will describe how they are using the latest capabilities in Synopsys’ comprehensive test and yield solutions and the benefits they are seeing. 

Monday, November 11th, 6:00 PM - 9:30 PM

OMNI Hotel
2500 Calvert St NW
Washington, DC 20008

Agenda:

Welcome Reception
Opening by Dr. Aart de Geus, Chairman and co-CEO
Dinner and Presentations
• Intel
• Samsung
• Avera Semi
• Advantest
Dessert and Prize Drawing

Visit Synopsys at ITC

The Synopsys TestMAX® family contains unique capabilities for automotive test and functional safety as well as technologies that unlock new levels of test bandwidth and efficiency including leverage of high-speed interfaces common on many designs. Visit Synopsys in booth #301. 

Tuesday Morning Keynote

Aart de Geus, Chairman & CoCEO, Synopsys
“50 Years… Good Start!”

Technical Sessions, Workshops, Panels, and Poster Sessions

Date

Time

Location

Session

Presenter

Nov 11

5:30 – 6:30 PM

Washington 4

Panel: ITC VC Pitch Tank

Yervant Zorian

Nov 11

8:30 - 12:00 PM

Washington 1

Tutorial 7: Memory Test and Repair in FinFET Era

Yervant Zorian

Nov 11

1:00 – 4:30 PM

Washington 1

Tutorial 10: Automotive Reliability & Test Strategies

Riccardo Mariani (Intel), Yervant Zorian

Nov 12

12: 00 – 1:00 PM

Exhibit Hall B

Corporate Forum: Synopsys TestMAX Family of Test Products

Steve Pateras

Nov 12

3:00 – 4:30 PM

Washington 5

Special Technical Session AI 1: AI Policy

Mina Hanna

Nov 12

3:00 – 4:30 PM

Washington 4

Technical Session: Perspective on the Future of Hardware Security

Mike Borza, Shawn Fetterolf

Nov 12

5:00 – 6:30 PM

Washington 2

Technical Session 1: Standards in 50 Years

Adam Cron, Yervant Zorian

Nov 12

5:00 – 6:30 PM

Washington 3

Technical Session 3: CAD for Security

Mike Borza

Nov 13

3:00 – 4:30 PM

Washington 4

Technical Session 10: Automotive 1

Peter Wohl

Nov 13

5:00 – 6:30 PM

Washington 2

Technical Session 3: 3D Chip Products are Now Really Taking Off: Is the Test Community Ready for It?

Adam Cron

Nov 13

5:00 – 6:30 PM

Washington 4

Technical Session: Automotive Panel Meeting Automotive Quality and Safety Requirements

Yervant Zorian

Nov 13

11:30 – 1:30 PM

Exhibit Hall C

Poster 9: PS-XLBIST: Per-Shift X-tolerant Logic BIST

Peter Wohl, John Waicukauski, Frederic Neuveux

Nov 14

8:30 – 10:00 AM

Washington 5

Technical Session: AI, Machine Learning-Based DFT Recommendation System for ATPG QoR

Apik Zorian, Milir Vaseekar, Basim Shanyour

Nov 14

2:30 – 4:00 PM

Washington 4

Technical Sessions: Automotive Reliability and Safety

Memory FIT Rate Mitigation Technique for Automotive SoCs

Manufacturing Screening and Diagnostic Flow for Advanced Technologies Automotive System-on-Chips

 

Samvel Shoukourian

Karen Darbinyan

 

Nov 14-15: Automotive Reliability and Test Workshophttp://www.itctestweek.org/4th-automotive-reliability-and-test-workshop/