Synopsys customers are invited to attend our 27th Annual Test SIG event at the International Test Conference (ITC) 2019. This year’s agenda includes presentations from leading companies, which will describe how they are using the latest capabilities in Synopsys’ comprehensive test and yield solutions and the benefits they are seeing.
Monday, November 11th, 6:00 PM - 9:30 PM
2500 Calvert St NW
Washington, DC 20008
Opening by Dr. Aart de Geus, Chairman and co-CEO
Dinner and Presentations
• Avera Semiconductor
Dessert and Prize Drawing