Visit Synopsys at booth #13 at the International Reliability Physics Symposium (IRPS) conference and learn about our reliability solutions for in-design, in-ramp, in-production through in-field devices. Mission-critical IC applications such as automotive, space, and medical industries demand the highest standards for safety and reliability.  This demand requires a holistic and cohesive approach to reliability through each stage of a design. Synopsys provide solutions that address robustness and reliability challenges including self heating, electromigration, from transistor level through to chip and system development.

  • Our unique and pioneering technology in the area of Silicon Lifecycle Management (SLM) offers the ability to monitor and analyze a device throughout its complete lifecycle with our intelligently embedded monitors which collect a rich data set that feeds analytical engines to enable optimizations at every stage in each device’s lifecycle.
  • Synopsys PrimeSim™ Reliability Analysis solution unifies production proven and foundry-certified reliability analysis technologies covering electromigration/IR drop analysis, design robustness, MOS aging, analog fault simulation, and circuit checks (ERC) to enable full-lifecycle reliability verification.
  • Synopsys TestMAX™ XLBIST delivers a solution for in-system self-test of digital designs and is the industry’s first X-tolerant architecture that eliminates all Xs in a design. The result is smaller impact on test costs and faster time to market.

Our solutions provide insights at every phase of the device lifecycle to improve device resilience and reliability.



Learn More

Visit with us to learn more. If you are interested in scheduling an on-site meeting with Synopsys representatives, please contact us.