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On-Chip Clock and Process Monitoring Using STAR Hierarchical System’s Measurement Unit

Functional safety is one of the most critical priorities for system-on-chips (SoCs) that are involved in automotive, aerospace and industrial applications. These requirements are driven by standards such as ISO 26262 and are the backbone of the design and testing of automotive ICs.

Synopsys’ STAR Hierarchical System’s Measurement Unit helps ensure the accuracy of on-chip clock frequency and duty cycle measurements for these types of applications. STAR Hierarchical System’s Measurement Unit has clock and process monitoring capabilities that track embedded sensors and monitors and can also record and confirm that measurements meet on-silicon criteria for performance-focused FinFET technology nodes including 16-nm and 7-nm processes.

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