IEEE European Test Symposium 2019 (ETS19)

Date: May 27 - 31, 2019

Location: Kongresshaus, Baden Baden, Germany

At ETS19, Synopsys will present on maintaining automotive quality in microcontrollers (joint presentation with Infineon) and integrating memory test and repair IP.

Maintaining Automotive Quality for Next-Generation Microcontrollers
Joint Presentation by Infineon and Synopsys

When: Tuesday, May 28; 14:00 – 15:30 - Session 3A        

Presenters: Ralf Arnold, Infineon Technologies; Johanna Sepulveda TU-Munich; Vladimir Litovtchenko, Synopsys

Organizer: Daniel Tille, Infineon Technologies

Abstract: The systems and components of a modern self-driving car with high automation levels require constant improvement for quality and reliability. Such requirements are especially relevant for achieving SoC-level quality and reliability targeting zero defect parts-per-million levels. Automotive products, including IP, must also meet stringent functional safety requirements defined by the new edition of ISO 26262-2018 standard. The multi-dimensional set of challenges apply not only to OEMs but also propagates through the full supply chain including IP and library providers. This presentation will describe how quality, reliability, and functional safety requirements are addressed in automotive product design cycles at the IP level, focusing on qualification, test, and validation.


Tutorial: Test and Repair for SoC Memories and Hierarchical Test for AMS & PHY IP 

When: Wednesday, May 29; 09:15 – 09:45 - Session 7B   

Presenter: Yervant Zorian, Synopsys Fellow

Abstract: Memory test and repair at 7nm and smaller technologies present new and unique challenges to SoC and DFT designers. With growing process variation and complexity, SoC designers need to overcome new memory fault types (specific to FinFET) to offer high test coverage while satisfying performance and reliability needs specific to new applications like Artificial Intelligence, Machine Learning and Automotive.

This tutorial will introduce the next generation of STAR Memory System, Synopsys’ memory test and repair solution including details of the recently announced support for embedded MRAM (eMRAM) technology. The speaker will also discuss the DesignWare STAR Hierarchical System, a hierarchical test and diagnostics solution for all analog/mixed signal IP/cores on your SoC. The tutorial will cover test, repair, diagnostics as well as in-field self-test capabilities with examples of successful customer case studies.